IEC 60749-41:2020 PDF

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

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IEC 60749-41:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 44
Дата публикации:: 22 июля 2020 г.
Издание:: IEC IS 60749 edition 1 version 1
ICS:: 31.080.01

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Срок поставки:8 раб. дн. (перевод)

Цена:660 €

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IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

Технические детали

Технический комитет: TC 47 - Semiconductor devices
SKU: IEC 60749-41:2020

Abstract

Overview

IEC 60749-41:2020 is an international standard that defines standard reliability testing methods for non-volatile memory devices, specifically focusing on semiconductor devices. Published by the International Electrotechnical Commission (IEC), this standard outlines procedural requirements for conducting endurance, retention, and cross-temperature tests on non-volatile memories such as EEPROMs and flash memory. It provides a framework for validating the reliability of memory devices under various mechanical and climatic stresses.

This standard is crucial for manufacturers, test engineers, and quality assurance professionals in the semiconductor industry to ensure that non-volatile memory components meet stringent reliability criteria during their operational life.

Key Topics

Endurance Testing: IEC 60749-41 specifies the methodology for assessing a memory device’s ability to sustain repeated program/erase cycles without failure, verifying its long-term durability.
Data Retention Testing: Guidelines for verifying that memory devices can reliably retain stored data for the expected lifespan under specified environmental conditions are covered, including accelerated aging tests such as temperature baking.
Cross-Temperature Testing: The standard details methods for program/verify cycles across the operational temperature range - programming at low temperature and verifying at high temperature, and vice versa - to uncover temperature sensitivity issues in data retention or read performance.
Qualification Specifications: It refers to JESD47 and JESD94 for endurance and retention parameters, including cycle counts, durations, temperatures, and sampling sizes, promoting knowledge-based and stress-driven qualification processes.
Failure Criteria: Clear failure definitions and calculation methods for Uncorrectable Bit Error Rate (UBER) are provided to quantify device reliability accurately.
Test Apparatus and Procedures: Standardized test setups, cycling procedures, electrical verification techniques, and required measurement conditions ensure repeatable and consistent testing results.

Applications

IEC 60749-41:2020 serves multiple practical applications in the semiconductor and electronics industries:

Abstract

Overview

Key Topics

Endurance Testing: IEC 60749-41 specifies the methodology for assessing a memory device’s ability to sustain repeated program/erase cycles without failure, verifying its long-term durability.
Data Retention Testing: Guidelines for verifying that memory devices can reliably retain stored data for the expected lifespan under specified environmental conditions are covered, including accelerated aging tests such as temperature baking.
Cross-Temperature Testing: The standard details methods for program/verify cycles across the operational temperature range - programming at low temperature and verifying at high temperature, and vice versa - to uncover temperature sensitivity issues in data retention or read performance.
Qualification Specifications: It refers to JESD47 and JESD94 for endurance and retention parameters, including cycle counts, durations, temperatures, and sampling sizes, promoting knowledge-based and stress-driven qualification processes.
Failure Criteria: Clear failure definitions and calculation methods for Uncorrectable Bit Error Rate (UBER) are provided to quantify device reliability accurately.
Test Apparatus and Procedures: Standardized test setups, cycling procedures, electrical verification techniques, and required measurement conditions ensure repeatable and consistent testing results.

Applications

IEC 60749-41:2020 serves multiple practical applications in the semiconductor and electronics industries:

IEC 60749-41:2020 PDF

Технические детали

Abstract

Overview

Key Topics

Applications

Abstract

Overview

Key Topics

Applications

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